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Multiview Machine Learning

Cover von Multiview Machine Learning

Sun, Shiliang/Mao, Liang/Dong, Ziang et al

Springer Verlag GmbH

149.79

(inklusive MwSt.)

Verfügbarkeit: Besorgungstitel, Festbezug

Zusatztext

This book provides a unique, in-depth discussion of multiview learning, one of the fastest developing branches in machine learning. Multiview Learning has been proved to have good theoretical underpinnings and great practical success. This book describes the models and algorithms of multiview learning in real data analysis. Incorporating multiple views to improve the generalization performance, multiview learning is also known as data fusion or data integration from multiple feature sets. This self-contained book is applicable for multi-modal learning research, and requires minimal prior knowledge of the basic concepts in the field. It is also a valuable reference resource for researchers working in the field of machine learning and also those in various application domains.

Autorenportrait

Shiliang Sun received his Ph.D. degree in pattern recognition and intelligent systems from Tsinghua University, Beijing, China, in 2007. He is now a professor at the Department of Computer Science and Technology and the head of the Pattern Recognition and Machine Learning Research Group, East China Normal University, Shanghai, China. His current research interests include multiview learning, kernel methods, learning theory, probabilistic models, approximate inference, and sequential modeling. He has published 150+ research articles at peer-reviewed journals and international conferences. Prof. Sun is on the editorial board of several international journals, including IEEE Transactions on Neural Networks and Learning Systems, Information Fusion, and Pattern Recognition. Liang Mao is a senior Ph.D. student at the Department of Computer Science and Technology and the Pattern Recognition and Machine Learning Research Group, East China Normal University, Shanghai, China. His main research interest is multiview learning and probabilistic models.

Weitere Details

Erschienen: 17.01.2019

Umfang: x, 149 S., 3 s/w Illustr., 7 farbige Illustr., 149

Sprache: ENG

Einband: GEB

ISBN/EAN: 9789811330285

Umbreit-Nr.: 5615709

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