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Fault Analysis in Cryptography

Cover von Fault Analysis in Cryptography

Information Security and Cryptography

Marc Joye/Michael Tunstall

Springer Verlag GmbH

106.99

(inklusive MwSt.)

Verfügbarkeit: Besorgungstitel, Festbezug

Autorenportrait

Dr. Marc Joye gained a Habilitation (HDR) degree in Computer Science from the Université de Toulouse II in 2003; from 1999 to 2006, he worked in the Card Security Group of Gemplus (now Gemalto), and he has been a member of the Security & Content Protection Labs of Technicolor since 2006; he has published over 100 scientific articles on many aspects of cryptology, including side-channel attacks and fault attacks. Dr. Mike Tunstall is a researcher in the Bristol Cryptography Group at the University of Bristol; his research interests include smart card security, secure embedded software design; fault-based differential cryptanalysis, fault attacks, and side-channel analysis.

Weitere Details

Erschienen: 18.07.2014

Umfang: xvi, 356 S.

Sprache: ENG

Einband: KT

ISBN/EAN: 9783642436772

Umbreit-Nr.: 7002491

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