Integrated Imaging and Vision Techniques for Industrial Inspection
Advances and Applications, Advances in Computer Vision and Pattern Recognition
Zheng Liu/Hiroyuki Ukida/Pradeep Ramuhalli et al
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Zusatztext
This pioneering text/reference presents a detailed focus on the use of machine vision techniques in industrial inspection applications. An internationally renowned selection of experts provide insights on a range of inspection tasks, drawn from their cutting-edge work in academia and industry, covering practical issues of vision system integration for real-world applications. Topics and features: presents a comprehensive review of state-of-the-art hardware and software tools for machine vision, and the evolution of algorithms for industrial inspection; includes in-depth descriptions of advanced inspection methodologies and machine vision technologies for specific needs; discusses the latest developments and future trends in imaging and vision techniques for industrial inspection tasks; provides a focus on imaging and vision system integration, implementation, and optimization; describes the pitfalls and barriers to developing successful inspection systems for smooth and efficient manufacturing process.
Autorenportrait
Dr. Zheng Liu is an Associate Professor at the University of British Columbia, Kelowna, BC, Canada. Dr. Hiroyuki Ukida is an Associate Professor in the Institute of Technology and Science at the University of Tokushima, Japan. Dr. Pradeep Ramuhalli is a Senior Research Scientist at the Pacific Northwest National Laboratory, Richland, WA, USA. Dipl.-Ing. Kurt Niel is the Head of the Department of Metrology and Control Engineering at the University of Applied Sciences Upper Austria, Wels, Austria.
Weitere Details
Erschienen: 23.08.2016
Umfang: x, 541 S., 394 s/w Illustr., 13 farbige Illustr.,
Sprache: ENG
Einband: KT
ISBN/EAN: 9781447169802
Umbreit-Nr.: 2875935
